Surface morphology and X-ray photoelectron spectroscopy of BiFeO₃ thin films deposited on top of Ta₂O₅/Si layers

Al capping layers for nondestructive x-ray photoelectron spectroscopy analyses of transition-metal nitride thin films

architecture and engineering of nanoscale sculptured thin films and determination of their properties

چکیده ندارد.

X-ray photoelectron spectroscopic characterization of ultra-thin silicon oxide films on a Mo( 100) surface

Ultra-thin films of silicon oxides supported on a MoflOO) surface have been studied using X-ray photoelectron spectroscopy (XPS). The films were synthesized by evaporating Si onto the MO surface in oxygen ambient and were subsequently characterized using XPS with respect to the chemical states of silicon and the composition of the film. It has been found that the silicon oxide, prepared at room...

Quantitative analysis of povidone-iodine thin films by X-ray photoelectron spectroscopy and their physicochemical properties.

In this study, povidone-iodine (PVP-I) has been formulated as a topical spray to produce a thin film for the controlled release of I2. By means of experimental design, 27 formulations containing glycerol, ethanol, PEG 400, copovidone and HFA 134a as a propellant were prepared. The pH values of all formulations were in the range of 6-7. The viscosity was within the range of 11.9-85.9 mPa s. The ...

Ferroelectric fatigue endurance of Bi4−xLaxTi3O12 thin films explained in terms of x-ray photoelectron spectroscopy